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Exploring Scanning Probe Microscopy with Mathematica, Second Edition
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| Organization: | University of Arizona |
| Department: | College of Optical Sciences |
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| Publisher: | Wiley-VCH (Weinheim, Germany) |
| Additional cataloguing information: | ISBN-10: 3527406174 |
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Introduction | Uniform Cantilevers | Cantilever Conversion Tables | V-Shaped Cantilevers | Tip-Sample Adhesion | Tip-Sample Force Curve | Free Vibrations | Noncontact Mode | Tapping Mode | Metal-Insulator-Metal Tunneling | Fowler-Nordheim Tunneling | Scanning Tunnel Spectroscopy | Coulomb Blockade | Density of States | Electrostatics | Near-Field Optics | Constriction and Boundary Resistance | Scanning Thermal Conductivity Microscopy | Kelvin Probe Force Microscopy | Raman Scattering in Nanocrystals
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This book provides a complete set of educational models describing the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. It is both a professional reference and an advanced-level text, beginning with basics and moving on to the latest techniques, experiments, and theory.
The second edition features not only an accompanying CD-ROM with Mathematica code for all the examples, but also a new applications section, reflecting the many recent breakthroughs in the field.
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microscopy, cantilevers, constriction resistance, boundary resistance, coulomb blockade, electrostatics, tunneling, density of states, near field optics, Raman scattering, free vibrations, Kelvin probe force, scanning thermal conductivity, tapping mode, tip-sample
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