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Analytical fitting model for rough-surface BRDF

Ingmar G. E. Renhorn
Glenn D. Boreman
Journal / Anthology

Optics Express
Year: 2008
Volume: 16
Issue: 17
Page range: 12892-12898

A physics-based model is developed for rough surface BRDF, taking into account angles of incidence and scattering, effective index, surface autocovariance, and correlation length. Shadowing is introduced on surface correlation length and reflectance. Separate terms are included for surface scatter, bulk scatter and retroreflection. Using the FindFit function in Mathematica, the functional form is fitted to BRDF measurements over a wide range of incident angles. The model has fourteen fitting parameters; once these are fixed, the model accurately describes scattering data over two orders of magnitude in BRDF without further adjustment. The resulting analytical model is convenient for numerical computations.