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Title

Exploring Scanning Probe Microscopy with Mathematica, Second Edition
Author

Dror Sarid
Organization: University of Arizona
Department: College of Optical Sciences
Book information

Publisher: Wiley-VCH (Weinheim, Germany)
Copyright year: 2007
ISBN: 9783527406173
Medium: Hardcover
Includes: CD-ROM
Pages: 310
Out of print?: N
Additional cataloguing information: ISBN-10: 3527406174
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Contents

Introduction | Uniform Cantilevers | Cantilever Conversion Tables | V-Shaped Cantilevers | Tip-Sample Adhesion | Tip-Sample Force Curve | Free Vibrations | Noncontact Mode | Tapping Mode | Metal-Insulator-Metal Tunneling | Fowler-Nordheim Tunneling | Scanning Tunnel Spectroscopy | Coulomb Blockade | Density of States | Electrostatics | Near-Field Optics | Constriction and Boundary Resistance | Scanning Thermal Conductivity Microscopy | Kelvin Probe Force Microscopy | Raman Scattering in Nanocrystals
Description

This book provides a complete set of educational models describing the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. It is both a professional reference and an advanced-level text, beginning with basics and moving on to the latest techniques, experiments, and theory.

The second edition features not only an accompanying CD-ROM with Mathematica code for all the examples, but also a new applications section, reflecting the many recent breakthroughs in the field.
Subjects

*Science > Physics
*Science > Physics > Optics
*Science > Physics > Spectroscopy
Keywords

microscopy, cantilevers, constriction resistance, boundary resistance, coulomb blockade, electrostatics, tunneling, density of states, near field optics, Raman scattering, free vibrations, Kelvin probe force, scanning thermal conductivity, tapping mode, tip-sample
Related items

*Exploring Scanning Probe Microscopy with Mathematica   [in Books]