Scaling Rules for Nonlinear Thin Film Optical Waveguides -- from Wolfram Library Archive

Title

Scaling Rules for Nonlinear Thin Film Optical Waveguides

Author

M. Fontaine

Journal / Anthology

Applied Optics

Year:

1990

Volume:

Issue:

Page range:

3891-3899

Description

A mode power measure is applied to characterize nonlinear thin film optical waveguides in an approach analogous to that of Chelkowski and Chrostowski. Together with the normalized film thickness and the asymmetry coefficient, it allows us to get a concise overview of the waveguideing properties at a given power. For self-focusing film, we discuss the design conditions under which the degree of asymmetry significantly affects the waveguiding properties.

Subject

Science > Physics > Optics

Enable JavaScript to interact with content and submit forms on Wolfram websites. Learn how »