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Electron-Beam Scanning of ZnS Crystals: A Thermal Comparison of CRTs and Field-Emission Devices

W. Yared
Journal / Anthology

Journal of Imaging Science and Technology
Year: 1995
Volume: 38
Issue: 5
Page range: 448-452

The purpose of the present study is to examine the tradeoff between the high-intensity, short-duty-cycle excitation in a field emission device, as it affects the luminescent efficiency of the phosphor. Thermal conduction models describing both situations are built, and the models are validated with first-order energy balance estimates. The temperature buildup is then calculated for representative cases of both technologies by running a numerical implementation of the models on a Silicon Graphics workstation using Mathematica. The resuls are related to published experimental values on phosphor self-quenching and thermal breakdown. It is seen that thermal buildup is considerably more pronounced for field-emission devices, which places an upper bound on the pixel parallelism advantage they can provide over more traditional single-spot displays such as CRTs.

*Science > Physics > Optics